Our full range of portable ultrasonic and phased array flaw detectors provide outstanding capabilities for locating subsurface defects
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NDT Solutions
Flaw Detectors / Phased Array Flaw Detectors |
| Our full range of portable ultrasonic and phased array flaw detectors provide outstanding capabilities for locating subsurface defects. Using ultrasonic soundwaves, these advanced units can be used to locate and size hidden cracks, voids, disbonds, and similar discontinuities in a wide range of materials. Olympus offers a variety of devices for enhanced flaw detector inspection: the EPOCH™ 650 flaw detector is designed for excellent inspection performance and usability, while the EPOCH 6LT lightweight flaw detector is optimized for one-handed operation in rope access and high-portability applications. On this page, you will also find video tutorials for our flaw detectors that can help you unlock the capabilities to perform advanced and efficient ultrasonic testing. |
Eddy Current and Ultrasonic Flaw Detectors
Ultrasonic Flaw Detectors
Our range of ultrasonic (UT) flaw detectors offer leading-edge features and capabilities for locating discontinuities and other flaws.
Phased Array Flaw Detectors
Olympus phased array (PA) instruments produce accurate, detailed cross-sectional pictures of internal structures at fast inspection speeds. Units with TFM/FMC are available for advanced applications.
Eddy Current Flaw Detectors
Advanced eddy current (EC) flaw detectors are used to inspect metallic parts and perform highly reliable flaw detection of surface and near-surface defects.
Eddy Current Array Flaw Detectors
Eddy current array (ECA) instruments provide the ability to electronically drive and read eddy current sensors positioned side by side in the same probe assembly.
Bond Testing
Our complete line of bond testing (BT) flaw detectors provides outstanding capabilities for the location of discontinuities and other flaws in composite structures. We offer a wide range of measurement features and application-specific options for flaw detection.
